Optimal ADF STEM imaging parameters for tilt-robust image quantification
نویسندگان
چکیده
منابع مشابه
Effects of tilt on high-resolution ADF-STEM imaging.
A study of the effects of small-angle specimen tilt on high-resolution annular dark field images was carried out for scanning transmission electron microscopes with uncorrected and aberration-corrected probes using multislice simulations. The results indicate that even in the cases of specimen tilts of the order of 1 degree a factor of 2 reduction in the contrast of the high-resolution image sh...
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Multislice simulations in the transmission electron microscope (TEM) were used to examine changes in annular-dark-field scanning TEM (ADF-STEM) images, conventional bright-field TEM (BF-CTEM) images, and selected-area electron diffraction (SAED) patterns as atomically thin hexagonal boron nitride (h-BN) samples are tilted up to 500 mrad off of the [0001] zone axis. For monolayer h-BN the contra...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2015
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2015.04.010